High-Purity Silicon Wafer For Study 4 x P Type (Low Resistance)

High-Purity Silicon Wafer For Study 4 x P Type (Low Resistance)
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【Product Specifications】
・Size (inch) x conduction type: 4 x P type (low resistance)
・OF length (mm) x wafer thickness (μm): 32.5±2.5 x 525±25
・Quantity: 1 sheets
・Manufacturing method: CZ method
・Plane orientation: 100
・OF position: 110
・Resistance value: ≦0.02Ω・cm
・Particles: Particles ignored
・*Customization supported product:
・Orientation (cutting angle), OF position angle tolerance, Thickness tolerances can be processed with small and high-precision way, Accurate forming of grooves by etching is possible.
・Various shape processing and surface treatment are available. (Example: Spot facing processing product, Drilling processing product, Wafer with oxide film)
・Desired specific resistance, and wafer thickness can be supported.

Part Number

Configured Part Number is shown.

2-960-07

Part Number
2-960-07
Part NumberVolume DiscountDays to Ship
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